Equipment Description
The electron beam CHA Modified Mark-40 E-beam 2 evaporator is used to coat samples with various metals. A high-intensity beam of electrons is focused on the center of a crucible containing the material to be evaporated. The energy from the electron beam melts a region of the source metal. Material evaporates from the source and covers the sample with a thin layer.
Unlike sputtered films, evaporators only coat the surface facing away from the substrate. E-beam evaporators will provide very little coating to the sides of any features that are perpendicular to the surface of the substrate. In a typical process, the chamber is pumped down to a pressure of 5 x 10 -7 Torr. Typical deposition rates range from two to five angstroms per second. Typical thickness ranges from 10s of nanometers up to a micron.
Capable of evaporating: Titanium (Ti), Chrome (Cr), Gold (Au) , Nickel (Ni), Aluminum (Al), Copper (Cu) , Iron (Fe), Silver (Ag), Palladium (Pd), Other metals*
Manufacturer: CHA Industries
Model Number: Mark 40
Room Number: 1279
Radiation Safety Required: Yes
Institute |
Georgia Tech |
Department |
IEN - Micro/Nano Fabrication Facility |
Sub Tool Of
|
Marcus Inorganic Cleanroom |
System Components and Data
System Components: Ion gauge, valve controller, IC5/Deposition controller, crucible selector, power supply controller, XY sweep, shutter and hoist control
Specifications:
- Sample size based on sample holder -
- Flat Plate: Pieces to 12"
- 4" specific holder - holds three 4" wafers at a time
- 2" specific holder- up to 20 samples (dome shape)
Miscellaneous: The E-beam system holds six separate evaporation sources, allowing for evaporation of multiple materials in a single run. It has the capability to process a variety of sample sizes ranging from less than 1 cm2 to 4" wafers. It uses a cryo-pump for rapid pump down. Electron beam power is automatically controlled for uniform evaporation with little operator work. The E-beam system can process up to 20 3" (or less) samples simultaneously using a multiple-sample dome wafer holder
Metallization Calibration Data: (Updated Jan 2020)
|
Z-Ratio |
Tooling Factor |
Ti |
0.628 |
168.0 |
Cr |
0.305 |
231.7 |
Ni |
0.331 |
176.1 |
Fe |
0.349 |
100.0 |
Au |
0.381 |
166.4 |
Al |
1.080 |
156.3 |
Cu |
0.437 |
150.0 |
Ag |
0.529 |
180.0 |