IMS- Micro/Nano Fabrication Facility
Recipes, Troubleshooting & Data

Manufacturer's Standard Recipes  

Standard provided by the manufacturers (STS PECVD , PlasmaTherm deposition,RIE&ICP) for use in their processing tools. Georgia Tech access only-put your gatech e-mail as the user name microsoft will redirect to GT login.

Current Baseline Tests 

Reports on the based oon test runs on IEN tools to check film uniformity on deposition tools or etch rate on etching tools.

IEN Cleanroom Tool Recipe Suggestions

Standard recipe used in the IEN cleanroom in the processing tools.

NNIN RET Data

The National Nanotechnology Infrastructure Network (NINN) had a Research Experience for Teachers (RET) fellowship which sponsored teachers and community college faculty at Georgia Tech from (2006-2009) to let them activally engage in cleanroom research. These are the presentations associated with the program. 

Previous Baseline Tests & Users troubleshooting advice on processing issues 

they did for their process. Please note that these are records collected through over the decade. Georgia Tech access only-put your gatech e-mail as the user name microsoft will redirect to GT login.c

Contact Information
Hang Chen, Ph.D.
Process Support Manager
The Institute for Electronics and Nanotechnology at Georgia Tech
345 Ferst Drive, Atlanta GA, 30332 | 1152
404.894.3360 | hang.chen@ien.gatech.edu