IMS- Micro/Nano Fabrication Facility
Low Frequency

STS PECVD

Low Frequency
Temperature:
300 °C
Gases:
SiH4 (2% in N2) - 400 sccm
N2O - 1420 sccm
Pressure:
550 mTorr
Power:
60 W @ 380 KHz

Recipe: lfsio.set

N2O
1420 sccm
(2%) SiH4
400 sccm
Process Pressure
550 mT
APC Angle
67.8°
Process Temp.
300°C
Aux Temp.
250°C
RF Forward Power (380kHz)
60W
Load Position
10%
Tune Position
62%

 

Fit Parm:
Oxide Thickness Å
Index N @ 633nm
Index N@1550
MSE
Average:
7060.1
1.4677
1.4600
6.0880
Minimum:
7003.9
1.4495
1.4422
4.5900
Maximum:
7199.8
1.4737
1.4659
7.6000
Std Dev:
79.323
0.010272
0.010062
1.2212
% Range:
1.3874
0.82443
0.81164
24.721
 
1:(0.00,1.50)
7199.8
1.4495
1.4422
7.6000
2:(-1.50,0.00)
7003.9
1.4737
1.4659
5.5500
3:(0.00,0.00)
7042.6
1.4711
1.4635
5.6400
4:(1.50,0.00)
7030.2
1.4704
1.4625
7.0600
5:(0.00,-1.50)
7024.1
1.4737
1.4659
4.5900