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Processing
Equipment Baseline
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Processing Fundamentals
Doping Process
Etching Process
Dielectrics Etch
Gallium Nitride Etch
Indium Phosphide Etch
Silicon Nitride Etch
Silicon Oxide Etch
Zinc Sulfide Etch
Metal Etching
Polymer Etch
Semiconductor Etch
Lithography
Metrology
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Processing Information
Recipe Library
Silicon Oxide Etch
Plasma-Therm ICP
Standard
Temperature:
25 °C
He backside pressure (Torr):
7-9
Gases:
PR Mask
Cr Mask
CF
4
30 sccm
25 sccm
Pressure:
5 mTorr
12 mTorr
Power RF:
100 W
60 W
Power ICP:
400 W
800 W
Etch Rate:
2000 Å/min
3500 Å/min
High Selectivity
Temperature:
25 °C
Gases:
C
4
F
6
- 10 sccm
O
2
- 3 sccm
Ar - 15 sccm
CF
4
- 10 sccm
Pressure:
5 mTorr
Power RF:
400 W
Power ICP:
100 W
Etch Rate:
1265 Å/min
Selectivity:
10:1 SiO
2
:Si
virtually no PR etched
Plasma-Therm RIE
Temperature:
25 °C
Gases:
CHF
3
- 45 sccm
O
2
- 5 sccm
Pressure:
40 mTorr
Power:
200 W
DC-bias:
440 V
Etch Rate:
400 - 500 Å/min
Related Media
SiO2 Plasma Etch Standard Recipe on CtrLayer RIE 2
SiO2 Plasma Etch Standard Recipe on Vision RIE 1
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