Metal and Semiconductor Wet Etching
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-
Concentrations
|
Etchants
|
Rate (Å/sec)
|
Temp
|
1:1
|
H2o:HF
|
|
|
1:1:1
|
HCl:HNO3:H2O
|
|
|
dilute or concentrated
|
HCl
|
|
|
|
H3PO4:HNO3:HAc
|
|
|
19:1:1:2
|
H3PO4:HAc:HNO3:H2O
|
40
|
|
3:1:3:1
|
H3PO4:HAc:HNO3:H2O
|
8.7 @ RT
|
@ 40 C <4 min/micron
|
4:4:1:1
|
H3PO4:HAc:HNO3:H2O
|
5.6
|
|
15:0:1:1-4
|
H3PO4:HAc:HNO3:H2O
|
1500
|
40 C
|
8:1:1
|
H3PO4:H2O2:H2O
|
100
|
@ 35 C
|
3:1:5
|
H3PO4:H2O:glycerin
|
|
|
69:131
|
HClO4:HAc
|
|
|
4:1:5
|
HCl:FeCle:H2O
|
|
|
|
FeCl3:H2O
|
|
100 F
|
10%
|
K3Fe(CN)6
|
100
|
|
|
KOH:K3Fe(CN)6:K2B4O7.4H2O
|
|
|
2:3:12
|
KMnO4:NaOH:H2O
|
|
|
1:1:3
|
NH4OH:H2O2:H2O
|
|
|
20%
|
NH4SO4
|
|
|
dilute or concetrated
|
NaOH
|
|
|
8-10%
|
KOH
|
|
|
|
CCl4
|
|
boiling
|
10%
|
Br2:MeOH
|
|
warm
|
-
- 1:1:30 - H2SO4:H2O2 - 60 angstroms/sec
- 8:3:400 - NH3:H2O2:H2O - 25 angstroms/sec
- 1:1:10 - HF:H2O2:H2o - 80 angstroms/sec
-
- 1:1:3 - NH4OH:H2O2:H2O 80 C
- 10% Br2:MeOH
- 7ml:4g - H3PO:Cr2O3
-
- 1:1:1 - HCl:HNO3:H2O
- 90:10:1 - H2O:HNO3:HF
- 3:3:1:1 - H3PO4:HNO3:CH3COOH:H2O <<3min/1000A@50C
-
- 10:1 - H2O:HCl
-
- FeCl3
- 20% NHSO5
-
- 1% CrO3
-
- H3PO4:CrO3:NaCN
- 50% KOH (or NaOH) boiling
- HNO3 concentrated
- H2SO4 concentrated
- 3:1 - H2SO4:H2O2
-
- 2:3:12 KMnO4:NaOH:H2O
- 3:1 - H2O:H2O2
- HCl concentrated and dilute
- 3:1 - HCl:H2O2
- 2:1 - FeCl:HCl
- Cyantek CR-7s (Perchloric based) 7 min/micron (24A/s new)
- 1:1 - HCl:glycerine 12min/micron after depassivation
- 1:3 - [50gNaOH+100mlH2O]:[30g K3Fe(CN)6+100mlH2O] 1hr/micron
-
- 1:1 H2O:HNO3
- 3:1 HCl:H2O2
-
- 30% FeCl3 saturated solution
- 20% KCN
- 1:5 - H2O:HNO3
- HNO3 concentrated and dilute
- 1:1 - NH4OH:H2O2
- 1:20 - HNO3:H2O2
- 4:1 - NH3:H2O2
- 1:1:1 - H3PO4:HNO3:HAc
- 5ml:5ml:4g:1:90ml - HNO3:H2SO4:CrO3:NH4Cl:H2O
- 4:1:5 - HCL:FeCl3:H2O
-
- General Polymer Etch
- 5:1 - NH4OH:H2O2 120 C
- Gold Epoxy
- 3:1:10 HNO3:HCl:H2O
- Silver Epoxy
- 1:3 - HF:HNO3
- Aluminum Epoxy
- H2SO4 hot
- SU8 cured
- 3:1 - H2SO4:H2O2 - hot
-
- 1.5%-7.5% - Br2 in CH3OH
- 1:1 - NH4OH:H2O2
- 20:7:973 - NH4OH:H2O2:H2O
- 40:1:40 - H3PO4:H2O2:H2O
- 3:1:50 H3PO4:H2O2:H2O
- 33-66% - HNO3 red fuming etches more rapidly than white fuming
- 1:1 - HF:HNO3
- 1:1 - H2SO4:H2O2
- 1:1:30 - H2SO4:H2O2 - 60 angstroms/sec
- 8:3:400 - NH3:H2O2:H2O - 30 angstroms/sec, isotropic
- 1:1:10 - HF:H2O2:H2o - 80 angstroms/sec
-
- HF:HNO3:H2O
- 1:1:1 - HF:HNO3:HAc
- 7:1:x HF:HNO3:glycerin 35c 75-100 microns/hour, 100C 775microns/hour
- KF pH > 6
- 1:25 NH3OH:H2O2 1000 angstrom/min
-
- Aqua Regia 3:1 - HCl:HNO3 10-15 microns/min RT, 25-50 microns/min 35 C
- Chrome Regia 3:10-20% HCl:CrO3
- H2SeO4 Temp should be hot, etch is slow
- KCN in H20 - good for stripping gold from alumina, quartz, sapphire substrates, semiconductor wafers and metal parts
- 4g:2g:10ml - KI:I2:H2O Hot (70C) 280 nm/min
- 1:2:3 - HF:HAc:HNO3
- 30:30:50:0.6 - HF:HNO3:HAc:Br2
- NaCN:H2O2
- 7g:25:g:100ml - KI:Br2:H2O
- 9g:1g:50ml - KBr:Br2:H2O 800 nm/min
- 9g:1g:50ml - NaBr:Br2:H2O 400nm/min
- 400g:100g:400ml - I2:KI:H2O 55C 1270A/sec
- 1:2:10 - I2:KI:H2O
- Au mask etch 4g:1g:40ml - KI:I2:H2O 1min/micron
-
- 20:1:1 - H2O:HF:H2O2
-
- Aqua Regia 3:1 - HCl:HNO3 hot
- HCl boiling, fast
- IPA
- EOH
- MeOH
- Rare Earth Indium Etchants
-
- 1:1:20 - H2SO4:H2O2:H2O - 30 angstroms/sec
-
- conc HCl - fast
-
- 1:1 - HCl:H3PO4 - fast
-
- NH4OH
-
- 1:1 - HCl:H2O 8 angstroms/sec
- 1:1:10 - HF:H2O2:H2O 125 angstroms/sec
-
- Aqua Regia 3:1 - HCl:HNO3 hot
-
- 1:1 - H2O:HCL
- 1:1 - H2O:HNO3
- 1:2:10 - I2:KI:H2O
-
- 1:1 - HAc:H2O2
-
- 10ml:1g - H2O:NaOH followed by 5ml:1g - H2O:CrO3
-
- 1:1 - HCl:H2O2
-
- 1:1:1 - HNO3:HAc:Acetone
- 1:1 - HF:HNO3
- 30% FeCl3
- 3:1:5:1 - HNO3:H2SO4:HAc:H2O 85 C 10 microns/min
- 3:7 - HNO3:H2O
- 1:1 - HNO3:HAc
- 10% g/ml Ce(NH4)2(NO3)6:H20
- HF, concentrated slow etchant
- H3PO4 slow etchants
- HNO3 rapid etchant
- HF:HNO3 etch rate determined by ratio, the greater the amount of HF the slower the reaction
- 4:1 - HCl:HNO3 increase HNO3 concentration increases etch rate
- 30% FeCl3
- 5g:1ml:150ml - 2NH4NO3.Ce(NO3)3.4(H2O):HNO3:H2O decreasing HNO3 amount increases the etch rate
- 3:3:1:1 - H3PO4:HNO3:CH3COOH:H2O ~15min/micron @ RT with air exposure every 15 seconds
-
- 1:1 - HF:HNO3
-
- Aqua Regia 3:1 - HCl:HNO3 hot
-
- General Polymer
- 5:1 - NH4OH:H2O2 120 C
- 5:1 - H2SO4:H2O2
- H2SO4:(NH4)2S2O8
- Acetone
-
- Aqua Regia 3:1 - HCl:HNO3 Hot
- Molten Sulfur
-
- 5:1 - NH4OH:H2O2 120 C
- 3:1 - H2SO4:H2O2
-
- 1:1 - HF:H2O
- 1:1 - HF:HNO3
- Sodium Carbonate boiling
- HF conc
-
- Aqua Regia 3:1 - HCl:HNO3 - Hot
-
- 64:3:33 - HNO3:NH4F:H2O 100 angstroms/s
- 61:11:28 - ethylenediamine:C6H4(OH)2:H2O 78 angstroms/s
- 108ml:350g:1000ml - HF:NH4F:H2O slow 0.5 angstroms/min
- 1:1:50 - HF:HNO3:H2O slow etch
- KCl dissolved in H2O
- KOH:H2O:Br2/I2
- KOH see section on KOH etching of silicon
- 1:1:1.4:0.15%:0.24% - HF:HNO3:HAc:I2:triton
- 1:6:3 - HF:HNO3:HAc and 0.19 g NaI per 100 ml solution
- 1:4 - Iodine Etch:HAc
- 0.010 N NaI
- NaOH
- HF:HNO3
- 1:1:1 - HF:HNO3:H2O
-
- BOE 1:5:5 HF:NH4HF:H2O 20 angstroms/s
- HF:HNO3
- 3:2:60 HF:HNO3:H20 2.5 angstroms/sec at RT
- BHF 1:10, 1:100, 1:20 HF:NH4F(sat)
- Secco etch 2:1 HF:1.5M K2Cr2O7
- 5:1 NH4.HF:NaF/L (in grams)
- 1g:1ml:10ml:10ml NH4F.HF:HF:H2O:glycerin
- HF hot
- 1:1 1:15, 1:100 HF:H2O
- BOE HF:NH4F:H2O
- 1:6 BOE:H2O
- 5:43, 1:6 HF:NH4F(40%)
- NaCO3 100 C 8.8 mm/h
- 5% NaOH 100 C 150 mm/h
- 5% HCl 95 C 0.5mm/day
- KOH see KOH etching of silicon dioxide and silicon nitride
-
- 1:60 or 1:20 HF:H2O 1000-2000 A/min
- BHF 1:2:2 HF:NH4F:H2O slow attack but faster for silicon oxynitride
- 1:5 or 1:9 HF:NH4F (40%)0.01-0.02 microns/second
- 3:25 HF:NH4F.HF(sat)
- 50ml:50g:100ml:50ml HF:NH4F.HF:H2O:glycerin glycerin provides more uniform removal
- BOE HF:NH4F:H2O
- 18g:5g:100ml NaOH:KHC8H4O4:H2O boiling 160 A/min, better with silicon oxynitride
- 9:g25ml NaOH:H20 boiling 160A/min
- 18g:5g:100ml NaOH:(NH4)2S2O8:H2O boiling 160 A/min
- A) 5g:100ml NH4F.HF:H2O B)1g:50ml:50ml I2:H2O:glycerin mix A and B 1:1 when ready to use. RT 180 A/min
-
- 1:1 NH4OH:H2O2
- 3:3:23:1 H3PO4:HNO3:CH3COOH:H2O ~10min/100A
- 1:1:4 NH4OH:H2O2:CH3OH .36micron/min resist
- 1:1:1 HCl:HNO3:H2O
- 1-8:1HNO3:H2O
- 1 M HNO3 + light
-
- 1:1 HF:HNO3
-
- 1:1 HF:HNO3
-
- 1:1 HF:HCL
- 1:1 HF:HNO3
- 1:1 HF:H2O
- 2:7 HClO4:HAc
-
- 50:1:1 H2O:HF:HNO3
- 20:1:1 H2O:HF:H2O2
- RCA-1 ~100 min/micron
- x%Br2:ethyl acetate - HOT
- x%I2:MeOH - HOT
- HF:CuSO4
- 1:2 NH4OH:H2O2
- 1:2:7, 1:5:4, 1:4:5(18 microns/min), 1:1:50 HF:HNO3:H2O
- COOHCOOH:H2O any concentration
- 1:1:20 HF:H2O2:HNO3
- 1:9 HF:H2O 12 A/MIN
- HF:HCL:H2O
- HCL conc
- %KOH - conc
- %NaOH- conc
- 20% H2SO4 1 micron/min
- CCl3COOC2H5
- 25%HCOOH
- 20%H3PO4
- HF
-
- 1:1 HF:HNO3
- 1:1 HF:HNO3 thin films
- 3:7 HF:HNO3
- 4:1 HF:HNO3 rapid attack
- 1:2 NH4OH:H2O2 thin films good for etching tungsten from stainless steel, glass, copper and ceramics. Will etch titanium as well.
- 305g:44.5g:1000ml K3Fe(CN)6:NaOH:H2O rapid etch
- HCl slow etch (dilute or concentrated)
- HNO3 very slow etch (dilute or concentrated)
- H2SO4 slow etch (dilute or concentrated)
- HF slow etch (dilute or concentrated)
- H2O2
- 1:1, 30%:70%, or 4:1 HF:HNO3
- 1:2 NH4OH:H2O2
- 4:4:3 HF HNO3:HAc
- CBrF3 RIE etch
- 305g:44.5g:1000ml K3Fe(CN)6:NaOH:H2O very rapid etch
- HCl solutions slow attack
- HNO3 slight attack
- Aqua Regia 3:1 HCL:HNO3 slow attack when hot or warm
- H2SO4 dilute and concentrated slow etch
- HF dilute and concentrated slow etch
- Alkali with oxidizers (KNO3 and PbO2) rapid etch
- H2O2
-
- 1:1 H2O:HNO3
- 1:1 HF:HNO3
-
- 1:1 HCl:H2O
- 1:1 HNO3:H2O
-
- 1:60 HCl:H2O - 1.9 microns/min
- 1:200 Hcl:H2O - 0.9 microns/min
- 1:500 HCl:H2O - 0.4 microns/min
- 1:900 HCl:H2O - 0.2 microns/min
- 1:100 HNO3:H2O - 0.9 microns/min
- 1:7 BOE - .06 microns/min
- 1:1:30 H3PO4:C6H8O7:H2O - 2.2 microns/min
- 1:5:60 H3PO4:C6H8O7:H2O - 1.8 microns/min
- 1:1:80 H3PO4:C6H8O7:H2O - 1.4 microns/min
- 1:1:150 H3PO4:C6H8O7:H2O - 1 micron/min
- 1:1:200 H3PO4:C6H8O7:H2O - 0.8 microns/min
- 1:2:300 H3PO4:C6H8O7:H2O - 0.65 microns/min
-
- 50:1:1 H2O:HF:HNO3
- 20:1:1 H2O:HF:H2O2